10:30am-11:00am >>Using True 3D to Optimize Your Dispensing Process: A Journey Toward Zero Defects Daniel Perry, Koh Young Technology, Inc.
11:00am-11:30am >>Calibration of Tweezer Meters Enabling Sub-1pF and Sub-1nH Measurements Michael Obrecht, Ph.D., Siborg Systems Inc
11:30am-12:00pm >>A Survey of the Sources of Ionic Contamination as Measured by Ion Chromatography during Electronics Manufacturing *Adam Klett, Ph.D., KYZEN Corporation Co-Authors: Ram Wissel, James Perigen, KYZEN Corporation
Tuesday October 22, 2024 10:30am - 12:00pm CDT
Room 44